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25. August 2011

YXLON attends GIFA 2011

YXLON at GIFA
YXLON at GIFA

YXLON recently showcased a range of products at GIFA 2011, the world's leading foundry technology trade fair, which took place from 28th June to 2nd July in Dusseldorf and attracted record numbers of visitors.

On the large YXLON stand, measuring over 100m 2, the company exhibited two of its universal X-ray inspection systems. Visitors showed great interest in the systems' numerous possible uses and in particular in the market-proven Y.MU2000-D system, equipped with a modern, digital flat-panel detector and Y.HDR Inspect technology. Y.HDR Inspect enables defects in both thin and thick sections of material of parts under inspection to be immediately identified in brilliant image quality and high contrast without changing the X-ray parameters.

The second highlight of YXLON's appearance at this year's show was the presentation of Y.Multiplex CT, with which computer tomography is moving out of the lab and into the production process. The CT inspection's sliced images provide information on the location and size of any defects present. Thanks to optimised methods, the CT results are available quickly and can be directly visualised on the X-ray system itself. The visitors at the show were particularly impressed by the speed of the CT scan during data capture and reconstruction, including in comparison with the competition.

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